Schurmann, Jurgen <br/><br/>
Pattern Classification: A Unified view of statistical and Neural approaches, Jurgen Schurmann, eng 

 - New York, John Wiley & sons, US  1996 
 - xvii, 373p.  24 cm. 
<br/><br/><label>ISBN: </label>0471135348 
<br/><br/><label>Dewey Class. No.: </label>006.4,  / D, Sch