Tanaka, Nobuo  _ <br/><br/>
Electron Nano-imaging  basics of imaging and diffraction for TEM and STEM 

 - Japan  Springer  2017 
 - xxviii, 333 p.  HB  24 cm. 
<br/><br/> Includes index 
<br/><br/><label>ISBN: </label>9784431565000 
<br/><br/><label>Subjects--Personal Names: </label>   _ 
<br/><br/><label>Subjects--Uniform Titles: </label><br/>Transmission electron microscopy, Scanning transmission electron microscopy.
<br/><br/><label>Dewey Class. No.: </label>502.825  / TAN