Electron Nano-imaging basics of imaging and diffraction for TEM and STEM

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TextPublication details: Japan Springer 2017Description: xxviii, 333 p. 24 cm. HBISBN:

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Cover image	Item type	Current library	Home library	Collection	Shelving location	Call number	Materials specified	Vol info	URL	Copy number	Status	Notes	Date due	Barcode	Item holds	Item hold queue priority	Course reserves
	Books	Central Library				502.825 TAN (Browse shelf(Opens below))					Available			224269

Includes index

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